SBIMetrology
Simulation-based inference for imaging and wafer metrology
NanoScatt
Sub-nanometer scatterometry for control of surface roughness in nanofabricated structures
Z-MRI
Zelfrijdend MRI
NIMITI
Nano-Integrated Molecular Imaging for Therapeutic Innovation
ASSURE
Advancing Personalized Home Care: Microscale Sensors for Daily Urine Analysis and Disease Monitoring
3DG
Analytic modeling of Green’s functions in 3D heterogeneous media
X-RAYcterization
An X-ray computational framework for integrated multiphase inorganic material characterization
iORC
Innovatieve optische reksensor voor grote vervorming van composieten
CORE
Contact Optimization for Reducer Efficiency
HDA
Holistic Design Automation for Semiconductor Manufacturing Equipment
PARTS
Plasma-Assisted Removal of Tin under EUV Source Conditions
ISPAM
Improving signal-to-noise in photo-acoustic wafer metrology
QSONET
Quantum Networks and security for Production Optical Networks
OPTIMA
Design OPtimization for AddiTItively MAnufactured Medical Implants
CHAOS