SIMBOND
Advanced computational modelling of bonding and debonding processes for high-precision equipment
MutePipe
Geavanceerde oplossingen voor stille pijpleidingen en een veilige omgeving
APCC
Advanced particle contamination control in high-tech systems
PANTHER
Painted Metallic Aircraft Scrap: Neutralizing Toxic Hazards and Exposure Risk
SBIMetrology
Simulation-based inference for imaging and wafer metrology
AIMIRA
Artificial Intelligence (AI)-driven Minimally Invasive Robot-Assisted Mesorectal Excision
NanoScatt
Sub-nanometer scatterometry for control of surface roughness in nanofabricated structures
Z-MRI
Zelfrijdend MRI
3DG
Analytic modeling of Green’s functions in 3D heterogeneous media
HDA
Holistic Design Automation for Semiconductor Manufacturing Equipment
ISPAM
Improving signal-to-noise in photo-acoustic wafer metrology
QSONET
Quantum Networks and security for Production Optical Networks
OPTIMA
Design OPtimization for AddiTItively MAnufactured Medical Implants
AMPLIFY
AugMenting Protection of communication LInes For quantum-resistant network securitY
PROMETHEUS